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The
TM-1000 from Hitachi
High-Technologies uses scanning electron microscope (SEM) technology,
greatly simplified for ease of use, while retaining remarkably powerful imaging
capabilities. Not only does it show surface morphology in stereoscopic detail,
it also shows contrast due to different average atomic number composition within
the sample. This allows different phases in materials to be distinguished or
heavy metal-labelled areas in a specimen to be located with ease. |
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